Product Details:
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Place of Origin: | China |
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Brand Name: | LEEB |
Certification: | CE, FCC EAC & ISO |
Model Number: | Leeb250A |
Payment & Shipping Terms:
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Minimum Order Quantity: | 1 Set |
Price: | Based on quantity |
Packaging Details: | Equipment Box |
Delivery Time: | In 7-10 work days |
Payment Terms: | T/T, PayPal, Western Union, L/C |
Supply Ability: | 500 sets per month |
Detail Information |
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Name: | Film Thickness Gauge | Application: | On Ferrous Metal |
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Principle: | Magnetic Method | Shell: | Plastic |
Probe: | Settled | Dimensions 115×55×23mm: | 115×55×23mm |
High Light: | Settled Fe Probe Coating Thickness Gauge,Leeb 250A Coating Thickness Gauge,Settled Fe Probe Film Thickness Tester |
Product Description
Settled Fe Probe Coating Thickness Gauge Film Thickness Tester
Settled Fe Probe And Plastic Shell Coating Thickness Gauge With Switch off automatically or manually
Functions & Features
Technical Parameters
Technical Parameters | ||||||||
Model No. | Leeb250A | |||||||
Measuring principle | Fe | |||||||
Measuring range (µm) | 0~1250μm | |||||||
Probe | Settled | |||||||
Shell | Plastic | |||||||
Accuracy | ±(1~3%H+1) μm; H refers to the thickness of testing piece | |||||||
Minimum resolution (µm) | 0.1μm | |||||||
Min curvature of the min area (mm) | Convex1.5 Concave9 | |||||||
Diameter of the min area (mm) | Φ7 | |||||||
Critical thickness of substrate (mm) | 0.5 | |||||||
Memory | 200 groups measured data | |||||||
Dimensions | 115*55*23mm | |||||||
Power supply | AAA Alkaline battery | |||||||
Standard Configuration |
Main unit,5 calibration specimens (48.5μm,99.8μm,249μm,513μm 1024μm),1 probe & substrate
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Optional Accessories |
Probes,Specimens,1 leather sheath
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Error code
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Implications of error code
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The cause and solution
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E02
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Probe or instrument damage | Repair probe or instrument |
E03
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Probe or instrument damage
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Repair probe or instrument
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E04
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Measured values occur large fluctuations
(For example when soft layer measurements);
Magnetic field effect
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When the measure menton
the softcover, auxiliary device to
measure should be adopted;Stay away from the
strong magnetic field environment
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E05
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Too close to the probe from the metal substrate when the phone is switched on
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Probe from the metal substrate
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E08
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Probe or instrument damage
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Repair probe or instrument
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E11
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Probe model in conformity with this group of the original data corresponding to the probe model
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Replace the suitable probe
Choose an unused group units
Delete after calibration again
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E15
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Zero deviation is too big, can not be zero
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Select the appropriate substrate or repair equipment
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E20
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This set of unit for calibration value
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Choose an unused group unit Or delete after calibration again
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