Chongqing Leeb Instrument Co.,Ltd

Non Ferrous Probe Film Thickness Tester With Limit Setting Function

Product Details:
Place of Origin: China
Brand Name: LEEB
Certification: CE, FCC & ISO
Model Number: Leeb252A
Payment & Shipping Terms:
Minimum Order Quantity: 1 Set
Price: Based on quantity
Packaging Details: Equipment Box
Delivery Time: In 7-10 work days
Payment Terms: T/T, PayPal, Western Union, L/C
Supply Ability: 500 sets per month
  • Detail Information
  • Product Description

Detail Information

Name: Film Thickness Gauge Application: On Ferrous And Non-Ferrous Metal
Principle: Magnetic & Eddy Current Method Probe: Changeable
Resolution (µm): 0.1 Memory: 200 Groups
High Light:

Leeb 252A Probe Film Thickness Tester


Leeb252A Film Thickness Tester


FCC Film Thickness Tester

Product Description

Non Ferrous Probe Film Thickness Tester With Limit Setting Function


Changeable Ferrous And Non-Ferrous Probe Plastic Shell Coating Thickness Gauge With Limit Setting Function


Functions & Features


●  High quality metal probes.
●  Two measuring methods:continuous and single;
●  Two working mode: direct and batch;
●  Limit setting function.
●  Switch off automatically or manually.



Measuring Materials
Eddy Current (NFe): Measuring the thickness of Non-conductive coating on non-magnetic metal substrate, such as rubber, plastic, paint, oxide on the base of aluminum, copper, zinc, tin.


Technical Parameters


Technical Parameters
Model No. Leeb252A
Measuring principle
Fe or NFe
Measuring range (µm) 0~1250μm
Shell Plastic
Accuracy ±(1~3%H+1) μm; H refers to the thickness of testing piece
Minimum resolution (µm) 0.1μm
Min curvature of the min area (mm) Convex1.5 Concave9
Diameter of the min area (mm) Φ7
Critical thickness of substrate (mm) 0.5
Memory 200 groups measured data
Dimensions 115*55*23mm
Power supply
AAA Alkaline battery
Standard Configuration
Main unit,1 probe & substrate
5 calibration specimens (48.5μm,99.8μm,249μm,513μm 1024μm),
Optional Accessories
Probes,Specimens,1 leather sheath


Measuring Conditions
a) The characteristics of substrate
    Standard methods for magnetic substrate of magnetic properties and surface roughness should be similar to the magnetic properties and surface roughness of specimens substrate.
    For eddy current method, the standard substrate of electrical properties should be similar to the electrical properties of specimens substrate.
b) The thickness of substrate
    Check whether the thickness of the substrate is lower than the minimum thickness, if not, can use one of method in 3.3 to calibrate.
c) Edge effect
    Should not be in the specimen shape changing places, such as edges, holes, and the place such as Angle measurement.
d) The curvature
    Should not be in curved surface measurement of the specimens.
e) Measurement and measured times
    Usually as a result of the instrument measurement result is not the same each time, so we must in every area from several measurement results.Coating thickness and surface rough degree of local differences, require at any repeated measurements in a specific area.
f)Surface cleanliness
    Before measurement, should remove any attached on the surface of a material, such as dust, grease and corrosion products, but do not remove any covering material.


High quality Equipment Box:
Non Ferrous Probe Film Thickness Tester With Limit Setting Function 0


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